Software reliability: measurement, prediction, application / John D. Musa [and] Anthony Iannino [and] Kazuhira Okumoto

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Material type: Text

TextLanguage: English Series: McGraw-Hil series in software engineering and technologyPublication details: New York McGraw-Hill Book Co. 1987Description: xvii, 621p. ill. 21cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Institute of Public Enterprise, Library S Campus	001.6425 MUS (Browse shelf(Opens below))	Available		011145

Includes bibliographical references and index

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