Software reliability: measurement, prediction, application / John D. Musa [and] Anthony Iannino [and] Kazuhira Okumoto
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | Institute of Public Enterprise, Library S Campus | 001.6425 MUS (Browse shelf) | Available | 011145 |
Includes bibliographical references and index
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